The right parameters for quality-critical processes

Hannover Messe 2013: NanoFocus presents optical 3D metrology for industrial production

At the exhibition area „MicroTechnology - Smart Systems for Automation“, NanoFocus AG presents its high-resolution optical 3D metrology and analysis software to characterize functional surfaces. The German metrology developer and manufacturer displays its patented µsurf technology, which was designed towards the requirements of industrial applications close to the production line.

The flexible surface measurement systems are optimally suited for roughness measurements according to international standards, as well as the analysis of topography, micro-geometry and layer thickness down to the nanometer range. Due to its advantages over other measurement technologies in the industrial environment, the robust µsurf sensor technology is already applied to many industries for 3D surface analysis. Not sensitive to influences such as vibration, the systems allow measuring on-site in the production environment. Within seconds, the surface can be captured and analyzed – contact-free and without any sample preparation. This allows components to be inspected before and after each process-step to optimize the value stream.

The µsurf metrology systems are available in different designs: from a compact desktop solution to hand-held systems for the measurement of large objects such as aluminum rolls and chassis parts. Customizations such as individually modifiable portal systems, or even the integration of the sensor into a production line is possible as well. Combined with specialized software solutions for analysis and automation, the NanoFocus metrology systems offer easy handling at a proven cost benefit. “Our metrology systems are ideal tools to qualify and more importantly quantify functional surfaces“, explains Jürgen Valentin, CTO of NanoFocus AG. „With the repeatable 3D data that is delivered within seconds, our customers have the right parameters at hand to optimize their quality-critical processes.”